MIL-PRF-22710H
3.8.1 Rotational torque (applicable to external drive shaft switches. When switches are tested as specified in
4.5.5.1, the torque required to rotate the shaft from each detent position to the next shall be within the specified limits
(see 3.1).
3.8.2 Operating force (applicable to switch modules or stacked switch modules). When switches are tested as
specified in 4.5.5.2, the tangential force required to rotate the shaft from each detent position to the next shall be
within the specified limits (see 3.1).
3.9 Stops (when applicable). When switches with stops are tested as specified in 4.5.6, there shall be no broken,
loose, deformed, or displaced parts, nor shall there be any slippage of moving parts.
3.10 Thermal shock. When switches are tested as specified in 4.5.7, there shall be no mechanical or electrical
damage, loosening of rivets or other fastening devices.
3.11.1 Pull. When switches are tested as specified in 4.5.8.1.1 and 4.5.8.1.2, the terminals shall withstand the
specified load without breaking or affecting the switching arrangement.
3.11.2 Bend (when applicable). When switches with terminals bent permanently out of shape are tested as
specified in 4.5.8.2, there shall be no breakage of terminals or visible cracks in either the terminals or the insulating
material.
3.12 Strength of mounting bushing (when applicable, see 3.1). When switches are tested as specified in 4.5.9,
there shall be no damage to the switch, or loosening or twisting of the bushing relative to the switch front plate
assembly.
3.13 Vibration. When switches are tested as specified in 4.5.10, any pair of mating contacts shall not open for a
period of time longer than 1 microsecond (ms) including bounce before reclosing, unless otherwise specified (see
3.1). There shall be no change in shaft position, or evidence of broken, loose, deformed, or displaced parts.
3.14 Shock (see 4.5.11). When switches are tested as specified in 4.5.11.1, mating contacts shall not open for a
period of time longer than 1 millisecond including bounce, unless otherwise specified (see 3.1). When tested as
specified in 4.5.11.2, contacts shall not open for a period longer than 5 milliseconds including bounce, unless
otherwise specified (see 3.1), before returning to the closed position before the end of the first bounce. There shall
be no change in shaft position, or evidence of broken, loose, deformed, or displaced parts.
3.15 Insulation resistance. When measured as specified in 4.5.12, the insulation resistance shall be greater than
1,000 megohms, unless otherwise specified (see 3.1).
3.16 Lamp retention (when applicable, see 3.1). When switches are tested as specified in 4.5.13, the captive
means shall be capable of retaining the lamp retention adapter.
3.17 Seal (when applicable, see 3.1). When switches are tested as specified in 4.5.14, the following requirements
shall apply.
3.17.1 Method I (mounting) (see 4.5.14.1). During the seal test, there shall be no evidence of a continuous stream
of air bubbles. During the dielectric withstanding voltage test, the leakage current shall not exceed 1.0 milliampere.
3.17.2 Method II (mounting) (see 4.5.14.2). There shall be no evidence of leakage as evidenced by a continuous
stream of air bubbles.
3.18 Dielectric withstanding voltage. When switches are tested as specified in 4.5.15, there shall be no arcing,
flashover, breakdown of insulation or damage, and the leakage current shall be not greater than 0.5 milliampere.
3.19 Moisture resistance (see 4.5.16). When switches are tested as specified in 4.5.16.1 or 4.5.16.2, the
insulation resistance shall be greater than 25 megohms, unless otherwise specified (see 3.1). At the conclusion of
the test, there shall be no evidence of measling, corrosion, breaking, cracking, spalling, or loosening of terminals
outside the confines of the terminal anchoring device, and mounting hardware shall be readily removable. There
shall be no peeling or chipping of the finish.
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